Travelled to:1 × USA
Collaborated with:B.Preas C.W.Gwyn
Talks about:analysi (2) design (2) mask (2) circuit (1) automat (1) inform (1) check (1) rule (1) base (1)
Person: Wray Lindsay Buntine
DBLP: Buntine:Wray_Lindsay
Contributed to:
1976Wrote 2 papers:
- DAC-1976-BuntineP #analysis #design
- Design rule checking and analysis of IC mask designs (WLB, BP), pp. 301–308.
- DAC-1976-PreasBG #analysis #automation
- Automatic circuit analysis based on mask information (BP, WLB, CWG), pp. 309–317.