Travelled to:
1 × USA
Collaborated with:
E.Jun J.Lee
Talks about:
understand (1) technolog (1) approach (1) dispens (1) viabil (1) simul (1) reduc (1) medic (1) error (1) rfid (1)
Person: Xiaobo Shi
DBLP: Shi:Xiaobo
Contributed to:
Wrote 1 papers:
- DHM-2009-JunLS #approach #fault #simulation
- A Simulation Approach to Understand the Viability of RFID Technology in Reducing Medication Dispensing Errors (EJ, JL, XS), pp. 531–539.