Travelled to:
1 × USA
Collaborated with:
S.Kang C.Kim
Talks about:
pattern (1) system (1) repeat (1) experi (1) analyz (1) usabl (1) evalu (1) user (1)
Person: Young Bin Kim
DBLP: Kim:Young_Bin
Contributed to:
Wrote 1 papers:
- DUXU-PMT-2013-KimKK #experience #usability #user interface
- System for Evaluating Usability and User Experience by Analyzing Repeated Patterns (YBK, SJK, CHK), pp. 322–329.