Chuan-Yu Chang, Si-Yan Lin, MuDer Jeng
Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection
CASE, 2005.
@inproceedings{CASE-2005-ChangLJ,
author = "Chuan-Yu Chang and Si-Yan Lin and MuDer Jeng",
booktitle = "{Proceedings of the First International Conference on Automation Science and Engineering}",
doi = "10.1109/COASE.2005.1506786",
isbn = "0-7803-9425-9",
pages = "301--306",
publisher = "{IEEE}",
title = "{Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection}",
year = 2005,
}