Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection
BibSLEIGH corpus
BibSLEIGH tags
BibSLEIGH bundles
BibSLEIGH people
EDIT!
CC-BY
Open Knowledge
XHTML 1.0 W3C Rec
CSS 2.1 W3C CanRec
email twitter

Chuan-Yu Chang, Si-Yan Lin, MuDer Jeng
Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection
CASE, 2005.

CASE 2005
DBLP
Scholar
DOI
Full names Links ISxN
@inproceedings{CASE-2005-ChangLJ,
	author        = "Chuan-Yu Chang and Si-Yan Lin and MuDer Jeng",
	booktitle     = "{Proceedings of the First International Conference on Automation Science and Engineering}",
	doi           = "10.1109/COASE.2005.1506786",
	isbn          = "0-7803-9425-9",
	pages         = "301--306",
	publisher     = "{IEEE}",
	title         = "{Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection}",
	year          = 2005,
}

Tags:



Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.