1 × Canada
1 × USA
Y.Pan H.Hu C.Chang S.Lin
use (2) semiconductor (1) manufactur (1) hopfield (1) deadlock (1) competit (1) prevent (1) network (1) flexibl (1) system (1)
Person: MuDer Jeng
Wrote 2 papers:
- CASE-2013-PanHJ #concurrent #flexibility #petri net #policy #using
- One computationally improved deadlock prevention policy for flexible manufacturing systems using Petri nets (YLP, HH, MJ), pp. 924–929.
- CASE-2005-ChangLJ #detection #fault #network #using
- Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection (CYC, SYL, MJ), pp. 301–306.