BibSLEIGH corpus
BibSLEIGH tags
BibSLEIGH bundles
BibSLEIGH people
Open Knowledge
XHTML 1.0 W3C Rec
CSS 2.1 W3C CanRec
email twitter
Travelled to:
1 × Canada
Collaborated with:
S.Lin M.Jeng
Talks about:
semiconductor (1) hopfield (1) competit (1) network (1) neural (1) detect (1) defect (1) wafer (1) layer (1) use (1)

Person: Chuan-Yu Chang

DBLP DBLP: Chang:Chuan=Yu

Contributed to:

CASE 20052005

Wrote 1 papers:

CASE-2005-ChangLJ #detection #fault #network #using
Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection (CYC, SYL, MJ), pp. 301–306.

Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
Hosted as a part of SLEBOK on GitHub.