Toshihiro Arima, Mitsukuni Tsuboya, Goro Amamiya, Jiro Okuda
A new heuristic test generation algorithm for sequential circuits
DAC, 1974.
@inproceedings{DAC-1974-ArimaTAO,
acmid = "811390",
author = "Toshihiro Arima and Mitsukuni Tsuboya and Goro Amamiya and Jiro Okuda",
booktitle = "{Proceedings of the 11th Design Automation Workshop}",
pages = "169--176",
publisher = "{ACM}",
title = "{A new heuristic test generation algorithm for sequential circuits}",
year = 1974,
}