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Travelled to:
1 × USA
Collaborated with:
T.Arima M.Tsuboya G.Amamiya
Talks about:
algorithm (1) sequenti (1) heurist (1) generat (1) circuit (1) test (1) new (1)

Person: Jiro Okuda

DBLP DBLP: Okuda:Jiro

Contributed to:

DAC 19741974

Wrote 1 papers:

DAC-1974-ArimaTAO #algorithm #generative #heuristic #testing
A new heuristic test generation algorithm for sequential circuits (TA, MT, GA, JO), pp. 169–176.
Bibliography of Software Language Engineering in Generated Hypertext (BibSLEIGH) is created and maintained by Dr. Vadim Zaytsev.
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