Sunil K. Jain, Vishwani D. Agrawal
Test generation for MOS circuits using D-algorithm
DAC, 1983.
@inproceedings{DAC-1983-JainA, acmid = "800642", author = "Sunil K. Jain and Vishwani D. Agrawal", booktitle = "{Proceedings of the 20th Design Automation Conference}", isbn = "0-8186-0026-8", pages = "64--70", publisher = "{ACM/IEEE}", title = "{Test generation for MOS circuits using D-algorithm}", year = 1983, }