Test generation for MOS circuits using D-algorithm
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Sunil K. Jain, Vishwani D. Agrawal
Test generation for MOS circuits using D-algorithm
DAC, 1983.

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@inproceedings{DAC-1983-JainA,
	acmid         = "800642",
	author        = "Sunil K. Jain and Vishwani D. Agrawal",
	booktitle     = "{Proceedings of the 20th Design Automation Conference}",
	isbn          = "0-8186-0026-8",
	pages         = "64--70",
	publisher     = "{ACM/IEEE}",
	title         = "{Test generation for MOS circuits using D-algorithm}",
	year          = 1983,
}

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