Andrzej Krasniewski, Alexander Albicki
Simulation-free estimation of speed degradation in NMOS self-testing circuits for CAD applications
DAC, 1985.
@inproceedings{DAC-1985-KrasniewskiA,
author = "Andrzej Krasniewski and Alexander Albicki",
booktitle = "{Proceedings of the 22nd Design Automation Conference}",
doi = "10.1145/317825.318001",
isbn = "0-8186-0635-5",
pages = "808--811",
publisher = "{ACM}",
title = "{Simulation-free estimation of speed degradation in NMOS self-testing circuits for CAD applications}",
year = 1985,
}