Travelled to:
2 × USA
Collaborated with:
∅ S.Pilarski A.Albicki
Talks about:
test (2) self (2) pseudoexhaust (1) techniqu (1) synthesi (1) circular (1) testabl (1) circuit (1) effici (1) degrad (1)
Person: Andrzej Krasniewski
DBLP: Krasniewski:Andrzej
Contributed to:
Wrote 3 papers:
- DAC-1991-Krasniewski #logic #performance #pseudo #synthesis #testing
- Logic Synthesis for Efficient Pseudoexhaustive Testability (AK), pp. 66–72.
- DAC-1987-KrasniewskiP #low cost #self
- Circular Self-Test Path: A Low-Cost BIST Technique (AK, SP), pp. 407–415.
- DAC-1985-KrasniewskiA #estimation #self
- Simulation-free estimation of speed degradation in NMOS self-testing circuits for CAD applications (AK, AA), pp. 808–811.