Dytest: A Self-Learning Algorithm Using Dynamic Testability Measures to Accelerate Test Generation
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Weiwei Mao, Michael D. Ciletti
Dytest: A Self-Learning Algorithm Using Dynamic Testability Measures to Accelerate Test Generation
DAC, 1988.

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@inproceedings{DAC-1988-MaoC,
	acmid         = "285730.285827",
	author        = "Weiwei Mao and Michael D. Ciletti",
	booktitle     = "{Proceedings of the 25th Design Automation Conference}",
	pages         = "591--596",
	publisher     = "{ACM}",
	title         = "{Dytest: A Self-Learning Algorithm Using Dynamic Testability Measures to Accelerate Test Generation}",
	year          = 1988,
}

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