Automatic Incorporation of On-Chip Testability Circuits
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Noriyuki Ito
Automatic Incorporation of On-Chip Testability Circuits
DAC, 1990.

DAC 1990
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@inproceedings{DAC-1990-Ito,
	author        = "Noriyuki Ito",
	booktitle     = "{Proceedings of the 27th Design Automation Conference}",
	doi           = "10.1145/123186.123393",
	isbn          = "0-89791-363-9",
	pages         = "529--534",
	publisher     = "{IEEE Computer Society Press}",
	title         = "{Automatic Incorporation of On-Chip Testability Circuits}",
	year          = 1990,
}

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