@inproceedings{DAC-1992-BhattacharyaAA,
	acmid         = "113938.119386",
	author        = "Debashis Bhattacharya and Prathima Agrawal and Vishwani D. Agrawal",
	booktitle     = "{Proceedings of the 29th Design Automation Conference}",
	isbn          = "0-8186-2822-7",
	pages         = "159--164",
	publisher     = "{IEEE Computer Society Press}",
	title         = "{Delay Fault Test Generation for Scan/Hold Circuits Using Boolean Expressions}",
	year          = 1992,
}