Ruifeng Guo, Sudhakar M. Reddy, Irith Pomeranz
Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction
DAC, 1999.
@inproceedings{DAC-1999-GuoRP, author = "Ruifeng Guo and Sudhakar M. Reddy and Irith Pomeranz", booktitle = "{Proceedings of the 36th Design Automation Conference}", doi = "10.1145/309847.310019", pages = "653--659", publisher = "{ACM Press}", title = "{Proptest: A Property Based Test Pattern Generator for Sequential Circuits Using Test Compaction}", year = 1999, }