Kwang-Ting Cheng, Sujit Dey, Mike Rodgers, Kaushik Roy
Test challenges for deep sub-micron technologies
DAC, 2000.
@inproceedings{DAC-2000-ChuengDRR,
author = "Kwang-Ting Cheng and Sujit Dey and Mike Rodgers and Kaushik Roy",
booktitle = "{Proceedings of the 37th Design Automation Conference}",
doi = "10.1145/337292.337353",
pages = "142--149",
publisher = "{ACM}",
title = "{Test challenges for deep sub-micron technologies}",
year = 2000,
}