Indradeep Ghosh, Masahiro Fujita
Automatic test pattern generation for functional RTL circuits using assignment decision diagrams
DAC, 2000.
@inproceedings{DAC-2000-GhoshF,
	author        = "Indradeep Ghosh and Masahiro Fujita",
	booktitle     = "{Proceedings of the 37th Design Automation Conference}",
	doi           = "10.1145/337292.337309",
	pages         = "43--48",
	publisher     = "{ACM}",
	title         = "{Automatic test pattern generation for functional RTL circuits using assignment decision diagrams}",
	year          = 2000,
}











