Indradeep Ghosh, Masahiro Fujita
Automatic test pattern generation for functional RTL circuits using assignment decision diagrams
DAC, 2000.
@inproceedings{DAC-2000-GhoshF,
author = "Indradeep Ghosh and Masahiro Fujita",
booktitle = "{Proceedings of the 37th Design Automation Conference}",
doi = "10.1145/337292.337309",
pages = "43--48",
publisher = "{ACM}",
title = "{Automatic test pattern generation for functional RTL circuits using assignment decision diagrams}",
year = 2000,
}











