Dongwoo Lee, Wesley Kwong, David Blaauw, Dennis Sylvester
Analysis and minimization techniques for total leakage considering gate oxide leakage
DAC, 2003.
@inproceedings{DAC-2003-LeeKBS,
author = "Dongwoo Lee and Wesley Kwong and David Blaauw and Dennis Sylvester",
booktitle = "{Proceedings of the 40th Design Automation Conference}",
doi = "10.1145/775832.775878",
isbn = "1-58113-688-9",
pages = "175--180",
publisher = "{ACM}",
title = "{Analysis and minimization techniques for total leakage considering gate oxide leakage}",
year = 2003,
}