New techniques for non-linear behavioral modeling of microwave/RF ICs from simulation and nonlinear microwave measurements
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David E. Root, John Wood, Nick Tufillaro
New techniques for non-linear behavioral modeling of microwave/RF ICs from simulation and nonlinear microwave measurements
DAC, 2003.

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@inproceedings{DAC-2003-RootWT,
	author        = "David E. Root and John Wood and Nick Tufillaro",
	booktitle     = "{Proceedings of the 40th Design Automation Conference}",
	doi           = "10.1145/775832.775856",
	isbn          = "1-58113-688-9",
	pages         = "85--90",
	publisher     = "{ACM}",
	title         = "{New techniques for non-linear behavioral modeling of microwave/RF ICs from simulation and nonlinear microwave measurements}",
	year          = 2003,
}

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