Travelled to:1 × USA
Collaborated with:D.E.Root J.Wood
Talks about:microwav (2) nonlinear (1) techniqu (1) behavior (1) measur (1) linear (1) simul (1) model (1) non (1) new (1)
Person: Nick Tufillaro
DBLP: Tufillaro:Nick
Contributed to:
2003Wrote 1 papers:
- DAC-2003-RootWT #behaviour #metric #modelling #simulation
- New techniques for non-linear behavioral modeling of microwave/RF ICs from simulation and nonlinear microwave measurements (DER, JW, NT), pp. 85–90.