Seung Hoon Choi, Bipul Chandra Paul, Kaushik Roy
Novel sizing algorithm for yield improvement under process variation in nanometer technology
DAC, 2004.
@inproceedings{DAC-2004-ChoiPR, author = "Seung Hoon Choi and Bipul Chandra Paul and Kaushik Roy", booktitle = "{Proceedings of the 41st Design Automation Conference}", doi = "10.1145/996566.996695", isbn = "1-58113-828-8", pages = "454--459", publisher = "{ACM}", title = "{Novel sizing algorithm for yield improvement under process variation in nanometer technology}", year = 2004, }