Seung Hoon Choi, Bipul Chandra Paul, Kaushik Roy
Novel sizing algorithm for yield improvement under process variation in nanometer technology
DAC, 2004.
@inproceedings{DAC-2004-ChoiPR,
author = "Seung Hoon Choi and Bipul Chandra Paul and Kaushik Roy",
booktitle = "{Proceedings of the 41st Design Automation Conference}",
doi = "10.1145/996566.996695",
isbn = "1-58113-828-8",
pages = "454--459",
publisher = "{ACM}",
title = "{Novel sizing algorithm for yield improvement under process variation in nanometer technology}",
year = 2004,
}











