Mapping statistical process variations toward circuit performance variability: an analytical modeling approach
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Yu Cao, Lawrence T. Clark
Mapping statistical process variations toward circuit performance variability: an analytical modeling approach
DAC, 2005.

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@inproceedings{DAC-2005-CaoC,
	author        = "Yu Cao and Lawrence T. Clark",
	booktitle     = "{Proceedings of the 42nd Design Automation Conference}",
	doi           = "10.1145/1065579.1065752",
	isbn          = "1-59593-058-2",
	pages         = "658--663",
	publisher     = "{ACM}",
	title         = "{Mapping statistical process variations toward circuit performance variability: an analytical modeling approach}",
	year          = 2005,
}

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