Travelled to:2 × USA
Collaborated with:Y.Cao S.Chellappa J.Ni X.Yao N.D.Hindman J.Velamala M.Chen
Talks about:variabl (2) character (1) approach (1) statist (1) process (1) perform (1) extract (1) circuit (1) variat (1) toward (1)
Person: Lawrence T. Clark
DBLP: Clark:Lawrence_T=
Contributed to:
20102005Wrote 2 papers:
- DAC-2010-ChellappaNYHVCCC #variability
- In-situ characterization and extraction of SRAM variability (SC, JN, XY, NDH, JV, MC, YC, LTC), pp. 711–716.
- DAC-2005-CaoC #approach #modelling #performance #process #statistics #towards #variability
- Mapping statistical process variations toward circuit performance variability: an analytical modeling approach (YC, LTC), pp. 658–663.