Full-chip analysis of leakage power under process variations, including spatial correlations
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Hongliang Chang, Sachin S. Sapatnekar
Full-chip analysis of leakage power under process variations, including spatial correlations
DAC, 2005.

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@inproceedings{DAC-2005-ChangS,
	author        = "Hongliang Chang and Sachin S. Sapatnekar",
	booktitle     = "{Proceedings of the 42nd Design Automation Conference}",
	doi           = "10.1145/1065579.1065716",
	isbn          = "1-59593-058-2",
	pages         = "523--528",
	publisher     = "{ACM}",
	title         = "{Full-chip analysis of leakage power under process variations, including spatial correlations}",
	year          = 2005,
}

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