Khaled R. Heloue, Navid Azizi, Farid N. Najm
Modeling and Estimation of Full-Chip Leakage Current Considering Within-Die Correlation
DAC, 2007.
@inproceedings{DAC-2007-HeloueAN,
author = "Khaled R. Heloue and Navid Azizi and Farid N. Najm",
booktitle = "{Proceedings of the 44th Design Automation Conference}",
doi = "10.1145/1278480.1278504",
pages = "93--98",
publisher = "{IEEE}",
title = "{Modeling and Estimation of Full-Chip Leakage Current Considering Within-Die Correlation}",
year = 2007,
}











