Quick detection of difficult bugs for effective post-silicon validation
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David Lin, Ted Hong, Farzan Fallah, Nagib Hakim, Subhasish Mitra
Quick detection of difficult bugs for effective post-silicon validation
DAC, 2012.

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@inproceedings{DAC-2012-LinHFHM,
	author        = "David Lin and Ted Hong and Farzan Fallah and Nagib Hakim and Subhasish Mitra",
	booktitle     = "{Proceedings of the 49th Annual Design Automation Conference}",
	doi           = "10.1145/2228360.2228461",
	isbn          = "978-1-4503-1199-1",
	pages         = "561--566",
	publisher     = "{ACM}",
	title         = "{Quick detection of difficult bugs for effective post-silicon validation}",
	year          = 2012,
}

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