David Lin, Ted Hong, Farzan Fallah, Nagib Hakim, Subhasish Mitra
Quick detection of difficult bugs for effective post-silicon validation
DAC, 2012.
@inproceedings{DAC-2012-LinHFHM,
author = "David Lin and Ted Hong and Farzan Fallah and Nagib Hakim and Subhasish Mitra",
booktitle = "{Proceedings of the 49th Annual Design Automation Conference}",
doi = "10.1145/2228360.2228461",
isbn = "978-1-4503-1199-1",
pages = "561--566",
publisher = "{ACM}",
title = "{Quick detection of difficult bugs for effective post-silicon validation}",
year = 2012,
}