Sheng-Yuan Lin, Jing-Yi Chen, Jin-Cheng Li, Wan-Yu Wen, Shih-Chieh Chang
A novel fuzzy matching model for lithography hotspot detection
DAC, 2013.
@inproceedings{DAC-2013-LinCLWC,
author = "Sheng-Yuan Lin and Jing-Yi Chen and Jin-Cheng Li and Wan-Yu Wen and Shih-Chieh Chang",
booktitle = "{Proceedings of the 50th Annual Design Automation Conference}",
doi = "10.1145/2463209.2488817",
isbn = "978-1-4503-2071-9",
pages = "6",
publisher = "{ACM}",
title = "{A novel fuzzy matching model for lithography hotspot detection}",
year = 2013,
}











