Travelled to:2 × USA
Collaborated with:S.Chang S.Lin J.Chen J.Li Y.Chen T.Wang K.Lai Y.Shi
Talks about:lithographi (1) threshold (1) monitor (1) hotspot (1) voltag (1) detect (1) design (1) degrad (1) critic (1) scale (1)
Person: Wan-Yu Wen
DBLP: Wen:Wan=Yu
Contributed to:
20142013Wrote 2 papers:
- DAC-2014-ChenWLWSC #design #monitoring #scalability
- Critical Path Monitor Enabled Dynamic Voltage Scaling for Graceful Degradation in Sub-Threshold Designs (YGC, TW, KYL, WYW, YS, SCC), p. 6.
- DAC-2013-LinCLWC #detection #fuzzy #novel
- A novel fuzzy matching model for lithography hotspot detection (SYL, JYC, JCL, WYW, SCC), p. 6.