Marcin Gebala, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer
On Using Implied Values in EDT-based Test Compression
DAC, 2014.
@inproceedings{DAC-2014-GebalaMMRT,
author = "Marcin Gebala and Grzegorz Mrugalski and Nilanjan Mukherjee and Janusz Rajski and Jerzy Tyszer",
booktitle = "{Proceedings of the 51st Annual Design Automation Conference}",
doi = "10.1145/2593069.2593173",
isbn = "978-1-4503-2730-5",
pages = "6",
publisher = "{ACM}",
title = "{On Using Implied Values in EDT-based Test Compression}",
year = 2014,
}