Travelled to:
1 × USA
Collaborated with:
G.Mrugalski N.Mukherjee J.Rajski J.Tyszer
Talks about:
compress (1) impli (1) valu (1) test (1) base (1) use (1) edt (1)
Person: Marcin Gebala
DBLP: Gebala:Marcin
Contributed to:
Wrote 1 papers:
- DAC-2014-GebalaMMRT #on the #using
- On Using Implied Values in EDT-based Test Compression (MG, GM, NM, JR, JT), p. 6.