@inproceedings{DAC-2014-KiamehrOTN,
	author        = "Saman Kiamehr and Thomas H. Osiecki and Mehdi Baradaran Tahoori and Sani R. Nassif",
	booktitle     = "{Proceedings of the 51st Annual Design Automation Conference}",
	doi           = "10.1145/2593069.2593196",
	isbn          = "978-1-4503-2730-5",
	pages         = "6",
	publisher     = "{ACM}",
	title         = "{Radiation-Induced Soft Error Analysis of SRAMs in SOI FinFET Technology: A Device to Circuit Approach}",
	year          = 2014,
}