Jaan Raik, Raimund Ubar
Sequential Circuit Test Generation Using Decision Diagram Models
DATE, 1999.
@inproceedings{DATE-1999-RaikU,
author = "Jaan Raik and Raimund Ubar",
booktitle = "{Proceedings of the Fourth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.1999.761212",
isbn = "0-7695-0078-1",
pages = "736--740",
publisher = "{IEEE Computer Society}",
title = "{Sequential Circuit Test Generation Using Decision Diagram Models}",
year = 1999,
}