Sequential Circuit Test Generation Using Decision Diagram Models
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Jaan Raik, Raimund Ubar
Sequential Circuit Test Generation Using Decision Diagram Models
DATE, 1999.

DATE 1999
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@inproceedings{DATE-1999-RaikU,
	author        = "Jaan Raik and Raimund Ubar",
	booktitle     = "{Proceedings of the Fourth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.1999.761212",
	isbn          = "0-7695-0078-1",
	pages         = "736--740",
	publisher     = "{IEEE Computer Society}",
	title         = "{Sequential Circuit Test Generation Using Decision Diagram Models}",
	year          = 1999,
}

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