Timothy J. Bergfeld, Dirk Niggemeyer, Elizabeth M. Rudnick
Diagnostic Testing of Embedded Memories Using BIST
DATE, 2000.
@inproceedings{DATE-2000-BergfeldNR,
author = "Timothy J. Bergfeld and Dirk Niggemeyer and Elizabeth M. Rudnick",
booktitle = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2000.840288",
isbn = "0-7695-0537-6",
pages = "305--309",
publisher = "{IEEE Computer Society}",
title = "{Diagnostic Testing of Embedded Memories Using BIST}",
year = 2000,
}