Travelled to:1 × Germany
4 × France
4 × USA
Collaborated with:J.H.Patel M.Abramovici G.S.Greenstein X.Yu T.J.Bergfeld D.Niggemeyer J.Wu M.S.Hsiao Y.Santoso M.C.Merten T.M.Niermann J.G.Holm D.G.Saab V.Chickermane P.Banerjee R.Vietti A.Ellis F.Corno P.Prinetto M.S.Reorda S.Venkataraman I.Hartanto W.K.Fuchs S.Chakravarty
Talks about:sequenti (8) circuit (7) test (7) generat (6) use (5) fault (4) genet (3) algorithm (2) techniqu (2) diagnost (2)
Person: Elizabeth M. Rudnick
DBLP: Rudnick:Elizabeth_M=
Contributed to:
2002
20001999199819971995199419941993Wrote 11 papers:
- DAC-2002-AbramoviciYR #low cost
- Low-cost sequential ATPG with clock-control DFT (MA, XY, EMR), pp. 243–248.
- DATE-2000-BergfeldNR #embedded #testing #using
- Diagnostic Testing of Embedded Memories Using BIST (TJB, DN, EMR), pp. 305–309.
- DATE-1999-SantosoMRA #generative #named #testing #using
- FreezeFrame: Compact Test Generation Using a Frozen Clock Strategy (YS, MCM, EMR, MA), p. 747–?.
- DATE-1999-WuGR #approach #fault #performance #reduction
- A Fault List Reduction Approach for Efficient Bridge Fault Diagnosis (JW, GSG, EMR), pp. 780–781.
- DATE-1998-RudnickVECPR #generative #performance #testing #using
- Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques (EMR, RV, AE, FC, PP, MSR), pp. 570–576.
- EDTC-1997-HsiaoRP #generative #testing #traversal #using
- Sequential circuit test generation using dynamic state traversal (MSH, EMR, JHP), pp. 22–28.
- DAC-1995-RudnickP #generative #search-based #testing
- Combining Deterministic and Genetic Approaches for Sequential Circuit Test Generation (EMR, JHP), pp. 183–188.
- DAC-1995-VenkataramanHFRCP #agile #fault #simulation #using
- Rapid Diagnostic Fault Simulation of Stuck-at Faults in Sequential Circuits Using Compact Lists (SV, IH, WKF, EMR, SC, JHP), pp. 133–138.
- DAC-1994-RudnickPGN #algorithm #framework #generative #search-based #testing
- Sequential Circuit Test Generation in a Genetic Algorithm Framework (EMR, JHP, GSG, TMN), pp. 698–704.
- EDAC-1994-RudnickHSP #algorithm #generative #search-based #testing
- Application of Simple Genetic Algorithms to Sequential Circuit Test Generation (EMR, JGH, DGS, JHP), pp. 40–45.
- DAC-1993-ChickermaneRBP
- Non-Scan Design-for-Testability Techniques for Sequential Circuits (VC, EMR, PB, JHP), pp. 236–241.