Juan M. Díez, Juan Carlos López
Influence of Manufacturing Variations in IDDQ Measurements: A New Test Criterion
DATE, 2000.
@inproceedings{DATE-2000-DiezL,
author = "Juan M. Díez and Juan Carlos López",
booktitle = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2000.840854",
isbn = "0-7695-0537-6",
pages = "645--649",
publisher = "{IEEE Computer Society}",
title = "{Influence of Manufacturing Variations in IDDQ Measurements: A New Test Criterion}",
year = 2000,
}











