Juan M. Díez, Juan Carlos López
Influence of Manufacturing Variations in IDDQ Measurements: A New Test Criterion
DATE, 2000.
@inproceedings{DATE-2000-DiezL, author = "Juan M. Díez and Juan Carlos López", booktitle = "{Proceedings of the Fifth Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2000.840854", isbn = "0-7695-0537-6", pages = "645--649", publisher = "{IEEE Computer Society}", title = "{Influence of Manufacturing Variations in IDDQ Measurements: A New Test Criterion}", year = 2000, }