Travelled to:1 × France
Collaborated with:J.C.López
Talks about:manufactur (1) criterion (1) influenc (1) variat (1) measur (1) test (1) iddq (1) new (1)
Person: Juan M. Díez
DBLP: D=iacute=ez:Juan_M=
Contributed to:
2000Wrote 1 papers:
- DATE-2000-DiezL #metric
- Influence of Manufacturing Variations in IDDQ Measurements: A New Test Criterion (JMD, JCL), pp. 645–649.