Anshuman Chandra, Krishnendu Chakrabarty
Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression
DATE, 2002.
@inproceedings{DATE-2002-ChandraC,
acmid = "874387",
author = "Anshuman Chandra and Krishnendu Chakrabarty",
booktitle = "{Proceedings of the Seventh Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2002.998362",
isbn = "0-7695-1471-5",
pages = "598--603",
publisher = "{IEEE Computer Society}",
title = "{Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression}",
year = 2002,
}











