A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories
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Paolo Bernardi, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante
A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories
DATE, 2003.

DATE 2003
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@inproceedings{DATE-2003-BernardiRRV,
	acmid         = "1022810",
	author        = "Paolo Bernardi and Maurizio Rebaudengo and Matteo Sonza Reorda and Massimo Violante",
	booktitle     = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2003.10172",
	isbn          = "0-7695-1870-2",
	pages         = "10720--10725",
	publisher     = "{IEEE Computer Society}",
	title         = "{A P1500-Compatible Programmable BIST Approach for the Test of Embedded Flash Memories}",
	year          = 2003,
}

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