Dhiraj K. Pradhan, Chunsheng Liu, Krishnendu Chakrabarty
EBIST: A Novel Test Generator with Built-In Fault Detection Capability
DATE, 2003.
@inproceedings{DATE-2003-PradhanLC,
acmid = "1022730",
author = "Dhiraj K. Pradhan and Chunsheng Liu and Krishnendu Chakrabarty",
booktitle = "{Proceedings of the Eighth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2003.1186390",
isbn = "0-7695-1870-2",
pages = "10224--10229",
publisher = "{IEEE Computer Society}",
title = "{EBIST: A Novel Test Generator with Built-In Fault Detection Capability}",
year = 2003,
}