Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Larry T. Pileggi
Specification Test Compaction for Analog Circuits and MEMS
DATE, 2005.
@inproceedings{DATE-2005-BiswasLBP,
author = "Sounil Biswas and Peng Li and R. D. (Shawn) Blanton and Larry T. Pileggi",
booktitle = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2005.277",
isbn = "0-7695-2288-2",
pages = "164--169",
publisher = "{IEEE Computer Society}",
title = "{Specification Test Compaction for Analog Circuits and MEMS}",
year = 2005,
}











