Specification Test Compaction for Analog Circuits and MEMS
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Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Larry T. Pileggi
Specification Test Compaction for Analog Circuits and MEMS
DATE, 2005.

DATE 2005
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@inproceedings{DATE-2005-BiswasLBP,
	author        = "Sounil Biswas and Peng Li and R. D. (Shawn) Blanton and Larry T. Pileggi",
	booktitle     = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2005.277",
	isbn          = "0-7695-2288-2",
	pages         = "164--169",
	publisher     = "{IEEE Computer Society}",
	title         = "{Specification Test Compaction for Analog Circuits and MEMS}",
	year          = 2005,
}

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