Sounil Biswas, Peng Li, R. D. (Shawn) Blanton, Larry T. Pileggi
Specification Test Compaction for Analog Circuits and MEMS
DATE, 2005.
@inproceedings{DATE-2005-BiswasLBP, author = "Sounil Biswas and Peng Li and R. D. (Shawn) Blanton and Larry T. Pileggi", booktitle = "{Proceedings of the Ninth Conference on Design, Automation and Test in Europe}", doi = "10.1109/DATE.2005.277", isbn = "0-7695-2288-2", pages = "164--169", publisher = "{IEEE Computer Society}", title = "{Specification Test Compaction for Analog Circuits and MEMS}", year = 2005, }