Tong-Yu Hsieh, Kuen-Jong Lee, Melvin A. Breuer
Reduction of detected acceptable faults for yield improvement via error-tolerance
DATE, 2007.
@inproceedings{DATE-2007-HsiehLB,
author = "Tong-Yu Hsieh and Kuen-Jong Lee and Melvin A. Breuer",
booktitle = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1266366.1266717",
isbn = "978-3-9810801-2-4",
pages = "1599--1604",
publisher = "{ACM}",
title = "{Reduction of detected acceptable faults for yield improvement via error-tolerance}",
year = 2007,
}