Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V. Kodakara, David J. Lilja, Ajit Dingankar
Design fault directed test generation for microprocessor validation
DATE, 2007.
@inproceedings{DATE-2007-MathaikuttySKLD,
author = "Deepak Mathaikutty and Sandeep K. Shukla and Sreekumar V. Kodakara and David J. Lilja and Ajit Dingankar",
booktitle = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1266366.1266529",
isbn = "978-3-9810801-2-4",
pages = "761--766",
publisher = "{ACM}",
title = "{Design fault directed test generation for microprocessor validation}",
year = 2007,
}