Slow write driver faults in 65nm SRAM technology: analysis and March test solution
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Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
Slow write driver faults in 65nm SRAM technology: analysis and March test solution
DATE, 2007.

DATE 2007
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@inproceedings{DATE-2007-NeyGLPVB,
	author        = "Alexandre Ney and Patrick Girard and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel and Magali Bastian",
	booktitle     = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1145/1266366.1266479",
	isbn          = "978-3-9810801-2-4",
	pages         = "528--533",
	publisher     = "{ACM}",
	title         = "{Slow write driver faults in 65nm SRAM technology: analysis and March test solution}",
	year          = 2007,
}

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