Alexandre Ney, Patrick Girard, Christian Landrault, Serge Pravossoudovitch, Arnaud Virazel, Magali Bastian
Slow write driver faults in 65nm SRAM technology: analysis and March test solution
DATE, 2007.
@inproceedings{DATE-2007-NeyGLPVB,
author = "Alexandre Ney and Patrick Girard and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel and Magali Bastian",
booktitle = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
doi = "10.1145/1266366.1266479",
isbn = "978-3-9810801-2-4",
pages = "528--533",
publisher = "{ACM}",
title = "{Slow write driver faults in 65nm SRAM technology: analysis and March test solution}",
year = 2007,
}
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