Travelled to:1 × Germany
1 × USA
3 × France
Collaborated with:P.Girard S.Pravossoudovitch A.Virazel A.Toulouse D.Bernard P.Nouet D.Dumas A.Ney M.Bastian Y.Bonhomme L.Guiller
Talks about:fault (3) diagnosi (2) delay (2) interconnect (1) technolog (1) submicron (1) constrain (1) strategi (1) approach (1) variabl (1)
Person: Christian Landrault
DBLP: Landrault:Christian
Contributed to:
2007200419991994
1992Wrote 5 papers:
- DATE-2007-NeyGLPVB #analysis #fault
- Slow write driver faults in 65nm SRAM technology: analysis and March test solution (AN, PG, CL, SP, AV, MB), pp. 528–533.
- DATE-v1-2004-BonhommeGGLPV #design #power management
- Design of Routing-Constrained Low Power Scan Chains (YB, PG, LG, CL, SP, AV), pp. 62–67.
- DATE-1999-ToulouseBLN #3d #modelling #performance
- Efficient 3D Modelling for Extraction of Interconnect Capacitances in Deep Submicron Dense Layouts (AT, DB, CL, PN), pp. 576–580.
- EDAC-1994-DumasGLP #effectiveness #fault
- Effectiveness of a Variable Sampling Time Strategy for Delay Fault Diagnosis (DD, PG, CL, SP), pp. 518–523.
- DAC-1992-GirardLP #approach #novel
- A Novel Approach to Delay-Fault Diagnosis (PG, CL, SP), pp. 357–360.