Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs
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José Luis Rosselló, Carol de Benito, Sebastiàn A. Bota, Jaume Segura
Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs
DATE, 2007.

DATE 2007
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@inproceedings{DATE-2007-RosselloBBS,
	author        = "José Luis Rosselló and Carol de Benito and Sebastiàn A. Bota and Jaume Segura",
	booktitle     = "{Proceedings of the 11th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1145/1266366.1266645",
	isbn          = "978-3-9810801-2-4",
	pages         = "1271--1276",
	publisher     = "{ACM}",
	title         = "{Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs}",
	year          = 2007,
}

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