Travelled to:1 × France
Collaborated with:J.L.Rosselló S.A.Bota J.Segura
Talks about:resist (2) critic (2) statist (1) nanomet (1) model (1) dynam (1) delay (1) time (1) test (1) base (1)
Person: Carol de Benito
DBLP: Benito:Carol_de
Contributed to:
2007Wrote 1 papers:
- DATE-2007-RosselloBBS #statistics #testing
- Dynamic critical resistance: a timing-based critical resistance model for statistical delay testing of nanometer ICs (JLR, CdB, SAB, JS), pp. 1271–1276.