Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs
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Sudarshan Bahukudumbi, Krishnendu Chakrabarty, Richard Kacprowicz
Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs
DATE, 2008.

DATE 2008
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@inproceedings{DATE-2008-BahukudumbiCK,
	author        = "Sudarshan Bahukudumbi and Krishnendu Chakrabarty and Richard Kacprowicz",
	booktitle     = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
	doi           = "10.1109/DATE.2008.4484925",
	isbn          = "978-3-9810801-3-1",
	pages         = "1103--1106",
	publisher     = "{IEEE}",
	title         = "{Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs}",
	year          = 2008,
}

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