Aswin Sreedhar, Alodeep Sanyal, Sandip Kundu
On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits
DATE, 2008.
@inproceedings{DATE-2008-SreedharSK,
author = "Aswin Sreedhar and Alodeep Sanyal and Sandip Kundu",
booktitle = "{Proceedings of the 12th Conference on Design, Automation and Test in Europe}",
doi = "10.1109/DATE.2008.4484745",
isbn = "978-3-9810801-3-1",
pages = "616--621",
publisher = "{IEEE}",
title = "{On Modeling and Testing of Lithography Related Open Faults in Nano-CMOS Circuits}",
year = 2008,
}