S. Saqib Khursheed, Bashir M. Al-Hashimi, Peter Harrod
Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing
DATE, 2009.
@inproceedings{DATE-2009-KhursheedAH,
author = "S. Saqib Khursheed and Bashir M. Al-Hashimi and Peter Harrod",
booktitle = "{Proceedings of the 13th Conference on Design, Automation and Test in Europe}",
pages = "1349--1354",
publisher = "{IEEE}",
title = "{Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing}",
year = 2009,
}