Travelled to:1 × France
1 × Germany
Collaborated with:B.M.Al-Hashimi P.Harrod S.Yang D.Flynn
Talks about:design (2) gate (2) methodolog (1) reliabl (1) multipl (1) voltag (1) retent (1) reduct (1) defect (1) state (1)
Person: S. Saqib Khursheed
DBLP: Khursheed:S=_Saqib
Contributed to:
20102009Wrote 2 papers:
- DATE-2010-YangAFK #design #power management #reliability
- Scan based methodology for reliable state retention power gating designs (SY, BMAH, DF, SSK), pp. 69–74.
- DATE-2009-KhursheedAH #design #fault #multi #reduction
- Test cost reduction for multiple-voltage designs with bridge defects through Gate-Sizing (SSK, BMAH, PH), pp. 1349–1354.